Seminarium: Zone-plate based spectromicroscopy - investigating and preparing materials on the 10 nm scale
- Datum: –11.00
- Plats: Ångströmlaboratoriet Ångström 80115
- Föreläsare: Rainer Fink, FAU Erlangen-Nuremberg
- Kontaktperson: Bengt Lindgren
Fresnel-zone plate (FZP) based microspectroscopy in the soft x-ray regime has become a widely used technique in thin film studies. The spectroscopic fingerprint in NEXAFS is combined with spatial resolutions on the order of 25 nm. We have successfully employed scanning transmission x-ray microspectroscopy (STXM) on various organic thin film systems to evaluate structure-property relationships in ultrathin organic films and nanoscaled materials. E.g., in-operando studies were employed to investigate the electronic structure within the active channel of organic field-effect transistors (OFETs). The gate effect shows small variations in the unoccupied density of states (UDOS) thus opening the channel for charge transport.
Taking advantage of controlled molecular (resonant) excitations, we utilized the STXM probe to deposit metal nanostructures from metal-organic precursors offering a novel additive fabrication technology. Specifically with recent developments in FZP fabrication we are able to push the resolution limits below 10 nm.