Ion-beam based material analysis (IBA)

When ions interact with solids, many different processes can occur depending on the ion species and the primary incident energy. Ions are scattered, recoiling target atoms can leave the samples, photons and electrons are emitted, and nuclear reactions may occur.

In our group we are performing all standard Ion-Beam Analysis methods in dedicated beamlines and experimental setups. We feature conventional Rutherford Backscattering Spectrometry (RBS) for non-destructive depth profiling, Elastic Recoil Detection Analysis (ERDA) for light element detection, Nuclear Resonance Analysis (NRA) for isotopic tracing as well as Particle Induced X-ray Emission (PIXE) for trace element analysis. These experiments can partially be performed using a micro-beam or investigating channelling in single crystalline materials.

Selected publications

D. Kiefer, L. Yu, E. Fransson, D. Primetzhofer, A. Amassian, M. Campoy-Quiles, and C. Müller
A Solution Doped Polymer Semiconductor: Insulator Blends for Thermoelectrics
Advanced Science (2016) 1600203 doi: 10.1002/advs.201600203

A. Wagner, S. Pullen, S. Ott, D. Primetzhofer
The potential of ion beams for characterization of metal-organic frameworks
Nucl. Instr. and Meth. B 371 (2016) 327 doi: 10.1016/j.nimb.2015.10.059

Last modified: 2022-02-18